NSN 6625-01-581-4169

Semiconductor Device Test Set

FSC: 6625     NIIN: 015814169
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Product Characteristics

NSN:
6625015814169
Demilitarization:
DEMIL/MLI
INC:
25006
Shelf Life:
N/A
Width:
11.100 inches
Ac Voltage Rating:
100.0 volts or 115.0 volts or 230.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Depth:
8.500 inches
Electrical Power Source Relationship:
Operating
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Resistance, capacitance, inductance
Operating Test Capability:
Frequencies 20, 50, 60, 200, 500, and 2khz; voltages 200milli, 3, 5, 10, 15, and 20v; resistance 10, 50, 100, 500, 1k, 5k, 10k, 50k, 100k ohms
Phase:
Single
Functional Classification:
Aa-1.3
Functional Description:
Used to test passive devices, diodes, transistors, gated devices, optoelectronic devices, and integrated circuits
Height:
4.400 inches
Entry Date:
10-01-14
Relationship To Similar Equipment:
Tracker 2800s can scan multi-pin

Part Numbers

  • 99-0401
    HUNTRON INC
  • MIL-HDBK-300(PME)
    MIL-HDBK-300
  • TRACKER 2800
    HUNTRON INC

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-581-4169 test set,semiconductor device
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Cage Codes
HUNTRON INC - 57705
MIL-HDBK-300 - 1HBK1