NSN 6625-01-535-5582

Semiconductor Device Test Set

FSC: 6625     NIIN: 015355582

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Product Characteristics

NSN:
6625015355582
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Ac Voltage Rating:
115.0 volts and 230.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Electrical Power Source Relationship:
Operating
Test Type For Which Designed:
Automated test probe for printed circuit cards
Part Name Assigned By Controlling Agency:
Access automated probing station
Phase:
Single
Special Features:
Max probing area: 15.3" x 12.9"; max component height: 2.375"; computer interfaces: rs232 and pci bus

Part Numbers

  • 99-0376
    HUNTRON INC

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-535-5582 test set,semiconductor device
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