NSN 6625-01-433-2218

Semiconductor Device Test Set

FSC: 6625     NIIN: 014332218

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Product Characteristics

NSN:
6625014332218
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
End Application:
Milstar af terminal remoting syst m (maftrs)
Electrical Power Source Relationship:
Operating
Internal Battery Accommodation:
Included
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Zener diodes testing in high altitude electromagnetic pulse (hemp) filters in milstar af terminal remoting system
Special Features:
Open circuit voltage rise rate 200 v/s, 1000 v/s; output voltage 1000v; usable measuring range 10-1000 volts; test current for solid state protectors 1 ma at 10 pct; measurement accuracy .5 pct; 3 nema 5024 lithium batteries; storage temp m10 to 60 degrees c; operating temp 0 to 50 degrees c
Functional Description:
Uses a linear volt ramp generator, a low voltage capacitive discharge, current limit element, 1 mamp current detection & control circuit, & peak read metering system
Supplementary Features:
Used in conjunction with rockwell built hemp filter test set; josyln calls this a surge protector test set

Part Numbers

  • 4010-01
    BOURNS, INC.

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-433-2218 test set,semiconductor device
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