NSN 6625-01-391-4404

Semiconductor Device Test Set

FSC: 6625     NIIN: 013914404

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Product Characteristics

NSN:
6625013914404
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
9.000 inches
Depth:
11.000 inches
End Application:
Gpete program
Test Type For Which Designed:
Test signal frequency
Criticality Code Justification:
Feat
Special Features:
Items are being coded as critical to insure source inspection will be performed at the point of manufacture, prior to material receipt by the us navy or other dod components. These items are piece parts or end items in support of vital military hardware necessary to sustain the successful mission of the ships, submarines, and shore stations of the us navy. Critical features including, but not limited to, dimensions, tolerances/clearances, electronic characteristics, and metallurgical properties will bespecified for government q ar (quality assurance representatives) to insure the highest possible degree of quality and reliability of these parts being delivered under navicp contracts
Height:
4.000 inches

Part Numbers

  • 2000B
    HUNTRON INC
  • 99-0080
    HUNTRON INC

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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