NSN 6625-01-380-3727

Semiconductor Device Test Set

FSC: 6625     NIIN: 013803727

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Product Characteristics

NSN:
6625013803727
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
12.250 inches
Ac Voltage Rating:
Between 85.0 volts and 250.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Depth:
12.250 inches
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Impedance range: 100k, 10k, 1k, and 100 ohms; test frequencies: 60, 2000 hz sinewave
Phase:
Single
Special Features:
Unit requires ibm compatible compter and monitor; probe inputs: 2 banana jacks and 1 bnc connector; scanner inputs: 16, 30, 40, and 64 input connections; rs232 interface at 9600 baud; database management system for failure history and statistical reports
Functional Description:
General purpose troubleshooting system designed to test a variety of electronic circuits using menu driven software
Height:
3.000 inches

Part Numbers

  • R-4000A
    MOTOROLA, INC.

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-380-3727 test set,semiconductor device
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