NSN 6625-01-257-5258

Semiconductor Device Test Set

FSC: 6625     NIIN: 012575258

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Product Characteristics

NSN:
6625012575258
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
19.000 inches
Ac Voltage Rating:
110.0 volts and 125.0 volts and 216.0 volts and 250.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Depth:
25.000 inches
Electrical Power Source Relationship:
Operating
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Microcomputer controlled ram based test system for high throughput testing of the full range of linear devices
Special Features:
Display includes both pass/fail led and a range of video display modes; includes keyboard and mass storage; rs232 and ieee-488 interfaces
Height:
12.500 inches
Supplementary Features:
Manufacturers name: linear ic test system

Part Numbers

  • 1731-9700
    GENRAD INC

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-257-5258 test set,semiconductor device
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