NSN 6625-01-239-4638

Semiconductor Device Test Set

FSC: 6625     NIIN: 012394638
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Product Characteristics

NSN:
6625012394638
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
9.000 inches
Frequency Rating:
Between 50.0 hertz and 2000.0 hertz
Depth:
11.000 inches
Electrical Power Source Relationship:
Alternate operating
Inclosure Feature:
Single item w/carrying case
Test Type For Which Designed:
Leakage, bonding, failure, shorts, opens
Height:
4.000 inches
Supplementary Features:
Impedance ranges: open circuit voltage 10vp, 15vp, 20vp, 60vp; short circuit current 135marms, 9.0marms, 0.6marms

Part Numbers

  • 2000
    HUNTRON INC
  • 2000A
    HUNTRON INC
  • 403-6983
    NIMIKKEISTOKESKUS NCB FINLAND

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-239-4638 test set,semiconductor device
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Cage Codes
HUNTRON INC - 57705
NIMIKKEISTOKESKUS NCB FINLAND - A486G