NSN 6625-01-201-0653

Semiconductor Device Test Set

FSC: 6625     NIIN: 012010653

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Product Characteristics

NSN:
6625012010653
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Ac Voltage Rating:
115.0 volts
Frequency Rating:
60.0 hertz
Major Components:
Vmicrozoom microscope; s-930v finemotion micropositioner; sm-sp spung loaded probe tip holder; se-tz 5 micron tungsten probe tip; se-10tz 1 micron tungsten probe tip; s-2715 socket card adapter; s-vac vacuum pump w/10 ft. Oftubing
Electrical Power Source Relationship:
Operating
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Submicron geometry of integrated circuit chips

Part Numbers

  • S250
    LUCAS/SIGNATONE CORPORATION

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-201-0653 test set,semiconductor device
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