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- NSN 6625-01-201-0653
NSN 6625-01-201-0653
Semiconductor Device Test Set
FSC: 6625 NIIN: 012010653DODParts.com distributes electrical and electronic properties measuring and testing instruments, aircraft parts and consumables, electrical parts, fittings and other components for the aerospace and defense industries. Submit the short price quote form for NSN 6625-01-201-0653 to receive an up to date pricing and availability quote by email.
Product Characteristics
NSN:
6625012010653
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Ac Voltage Rating:
115.0 volts
Frequency Rating:
60.0 hertz
Major Components:
Vmicrozoom microscope; s-930v finemotion micropositioner; sm-sp spung loaded probe tip holder; se-tz 5 micron tungsten probe tip; se-10tz 1 micron tungsten probe tip; s-2715 socket card adapter; s-vac vacuum pump w/10 ft. Oftubing
Electrical Power Source Relationship:
Operating
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Submicron geometry of integrated circuit chips
Part Numbers
-
S250
LUCAS/SIGNATONE CORPORATION
Shipping & Handling
HMIRS:No information in HMIRS. Hazardous material unknown.
ESD:No known electrostatic discharge.
Schedule B:9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.
Professional Distribution
- ITAR Registered
- DDTC Registered
- HAZMAT Certified
- AS9120 Quality Standards
- 100% Quality Inspections
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