NSN 6625-01-152-1697

Semiconductor Device Test Set

FSC: 6625     NIIN: 011521697

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Product Characteristics

NSN:
6625011521697
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
250.0 millimeters
Ac Voltage Rating:
115.0 volts
Frequency Rating:
60.0 hertz
Depth:
286.0 millimeters
End Application:
Nsn 5826-00-117-7747 calibration bench mock up
Electrical Power Source Relationship:
Operating
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
In-circuit testing of components
Phase:
Single
Height:
86.0 millimeters

Part Numbers

  • 3110
    VU-DATA CORP

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-152-1697 test set,semiconductor device
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