NSN 6625-01-085-8037

Semiconductor Device Test Set

FSC: 6625     NIIN: 010858037
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Product Characteristics

NSN:
6625010858037
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
10.000 inches
Ac Voltage Rating:
115.0 volts
Frequency Rating:
60.0 hertz
Major Components:
Tester, solid state; test probes and cables
Depth:
11.250 inches
Electrical Power Source Relationship:
Alternate operating
Internal Battery Accommodation:
Not included
Material And Location:
Plastic housing
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Comparitor function, circuit boards with integrated circuits or hybrid circuits; in-circuit testing at low, medium and high impedance; circuit testing for current-limited circuit protection; in-circuit test of solid state components; reliable testing of electrolytic capacitors
Operating Test Capability:
Visual scope display projecting images indicating condition of a device under test
Phase:
Single
Height:
3.375 inches
Surface Treatment:
Plastic
Surface Treatment:
Plastic

Part Numbers

  • 1005B
    HUNTRON INC
  • 1005B-1
    HUNTRON INC
  • HTR 1005B
    HUNTRON INC
  • HTR1005B-1
    HUNTRON INC

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-085-8037 test set,semiconductor device
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Cage Codes
HUNTRON INC - 57705