NSN 6625-01-044-7748

Semiconductor Device Test Set

FSC: 6625     NIIN: 010447748
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Product Characteristics

NSN:
6625010447748
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
19.000 inches
Ac Voltage Rating:
110.0 volts
Frequency Rating:
60.0 hertz
Depth:
15.000 inches
Electrical Power Source Relationship:
Operating
Inclosure Feature:
Single item w/carrying case
Test Type For Which Designed:
Power and signal
Phase:
Single
Special Features:
Mfg name-transistor analyzer
Functional Description:
Allows plotting of transistor characteristic curves; any type of transistor test
Height:
8.000 inches
Supplementary Features:
Portable; leakage read down to 100 nanoamperes; continuous current

Part Numbers

  • 3490-A
    TRIPLETT BLUFFTON CORPORATION

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-044-7748 test set,semiconductor device
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TRIPLETT BLUFFTON CORPORATION - 60741