NSN 6625-01-034-0940

Semiconductor Device Test Set

FSC: 6625     NIIN: 010340940
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Product Characteristics

NSN:
6625010340940
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
11.200 inches
Ac Voltage Rating:
Between 117.0 volts and 234.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Depth:
12.200 inches
Electrical Power Source Relationship:
Operating
Internal Battery Accommodation:
Not included
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Evaluate digital integrated circuits
Operating Test Capability:
Data setup time 230/800 ns; clockpulse width 140/440 ns; output settling time 630/2760 ns
Phase:
Single
Height:
5.900 inches

Part Numbers

  • 1249
    ELECTRO SCIENTIFIC INDUSTRIES, INC.

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-01-034-0940 test set,semiconductor device
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Cage Codes
ELECTRO SCIENTIFIC INDUSTRIES, INC. - 9Y504