NSN 6625-00-808-1801

Semiconductor Device Test Set

FSC: 6625     NIIN: 008081801

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Product Characteristics

NSN:
6625008081801
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
16.750 inches
Length:
24.000 inches
Ac Voltage Rating:
Between 105.0 volts and 125.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Electrical Power Source Relationship:
Operating
Internal Battery Accommodation:
Not included
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Dynamic characteristic curves of junction and point contact transistors
Phase:
Single
Functional Classification:
Aa-3.3
Functional Description:
Used in checking and matching transistors in power supplies of gp-4
Height:
13.000 inches
Entry Date:
70-04-01
Reference Data And Literature:
T.O. 33a1-12-511-11
Relationship To Similar Equipment:
When exhausted use 6625002023475

Part Numbers

  • 575M0D122C
    TEKTRONIX, INC.

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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