NSN 6625-00-305-1444

Semiconductor Device Test Set

FSC: 6625     NIIN: 003051444
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Product Characteristics

NSN:
6625003051444
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
End Application:
Electronic systems test sets
Test Type For Which Designed:
Parameter characterization of semiconductor devices

Part Numbers

  • 6200B
    BAE SYSTEMS INFORMATION AND

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-00-305-1444 test set,semiconductor device
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Cage Codes
BAE SYSTEMS INFORMATION AND - 72314