NSN 6625-00-222-1117

Semiconductor Device Test Set

FSC: 6625     NIIN: 002221117
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Product Characteristics

NSN:
6625002221117
Demilitarization:
NO
INC:
25006
Shelf Life:
N/A
Width:
4.250 inches
Length:
5.500 inches
Joint Electronics Type Designation System Item Name:
Test set, semiconductor device
Joint Electronics Type Designation System Item Type Number:
Ts-3253/tpm-39
Material And Location:
Aluminum housing
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Microwave diode current
Operating Test Capability:
Microamphere meter range 0-1000 ua dc
Height:
3.880 inches
Surface Treatment:
Enamel
Surface Treatment:
Enamel
Fsc Application Data:
Test set, elect. Equip.

Part Numbers

  • 5999965
    HARRIS CORPORATION
  • TS-3253/TPM-39
    JOINT ELECTRONICS TYPE DESIGNATION

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-00-222-1117 test set,semiconductor device
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Cage Codes
HARRIS CORPORATION - 24930
JOINT ELECTRONICS TYPE DESIGNATION - 80058