NSN 6625-00-179-5844

Semiconductor Device Test Set

FSC: 6625     NIIN: 001795844
Price Quote  

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Product Characteristics

NSN:
6625001795844
Demilitarization:
DEMIL/MLI
INC:
25006
Shelf Life:
N/A
Width:
8.000 inches
Length:
9.000 inches
Ac Voltage Rating:
115.0 volts
Dc Voltage Rating:
Between 2.0 volts and 9.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Major Components:
Test set, semiconductor device; cover, test set; lead, test; prod, test
Accessory Component Quantity:
1 and 1 and 1 and 1
Accessory Controlling Agency:
Jetds and jetds and jetds and jetds
Accessory Identifying Number:
Ts-2798/usm-206a type no. And cw-1049/usm-206a type no. And cx-11898/usm-206a type no. And mx-6825a/usm-206a type no.
Joint Electronics Type Designation System Item Name:
Test, semiconductor device
Joint Electronics Type Designation System Item Type Number:
Type no. An/usm-206a
Internal Battery Accommodation:
Included
Material And Location:
Plastic carrying case
Inclosure Feature:
Single item w/carrying case
Test Type For Which Designed:
Transistor beta and transconductance measurements; diode and transistor electrode resistance; diode and transistor reverse leakage measurements; shorted or open diode test; battery tests
Operating Test Capability:
Meter; micromhos; beta; leakage test; battery test
Phase:
Single
Height:
10.000 inches

Part Numbers

  • 902-470
    HICKOK INCORPORATED
  • ANUSM206A
    JOINT ELECTRONICS TYPE DESIGNATION

Shipping & Handling

HMIRS:

No information in HMIRS. Hazardous material unknown.

ESD:

No known electrostatic discharge.

Schedule B:

9030908030 - Parts and accessories of articles of schedule b subheading 9030.39.

Professional Distribution

  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   AS9120 Quality Standards
  •   100% Quality Inspections
ITAR registered supplier

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NSN: 6625-00-179-5844 test set,semiconductor device
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Cage Codes
HICKOK INCORPORATED - 28569
JOINT ELECTRONICS TYPE DESIGNATION - 80058