NSN 5961-00-008-7000

Unitized Semiconductor Devices

FSC: 5961     NIIN: 000087000
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NSN 5961-00-008-7000 Description

Metal in closure material, 0.250 inches overall length, 0.500 inches terminal length, 0.352 inches overall diameter, TO-77 joint electronic device engineering council/jedec/case outline designation.

Product Characteristics

NSN:
5961000087000
Demilitarization:
NO
INC:
61962
Shelf Life:
N/A
Inclosure Material:
Metal
Overall Length:
0.250 inches
Terminal Length:
0.500 inches
Overall Diameter:
0.352 inches
Joint Electronic Device Engineering Council/jedec/case Outline Designation:
To-77
Component Name And Quantity:
2 transistor
Mounting Method:
Terminal
Features Provided:
Hermetically sealed case
Semiconductor Material:
Silicon all transistor
Voltage Rating In Volts Per Characteristic:
30.0 breakdown voltage, collector-to-emitter, base open all transistor and 6.0 breakdown voltage, emitter-to-base, collector open all transistor
Current Rating Per Characteristic:
2.00 nanoamperes zero-gate-voltage source current preset all transistor
Power Rating Per Characteristic:
400.0 watts large-signal input power, common-emitter preset all transistor
Transfer Ratio:
900.0 static forward current transfer ratio, common-emitter all transistor
Special Features:
All transistor junction pattern arrangement: npn
Terminal Type And Quantity:
8 uninsulated wire lead

Part Numbers

  • 200140
    ASTRONICS TEST SYSTEMS INC.

Shipping & Handling

HMIRS:

No MSDS. No hazardous material.

ESD:

No known electrostatic discharge.

Schedule B:

8541500080 - Semiconductor devices, nesoi.

Professional Distribution

  •   ITAR Registered
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ITAR registered supplier

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ASTRONICS TEST SYSTEMS INC. - 21793