5910-01-536-5580
Find complete technical information, availability, and procurement data for: 5910-01-536-5580
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An active semiconductor device with three or more electrodes. May or may not include mounting hardware and/or heatsink. Excludes:semiconductor device, diode and semiconductor device, thyristor. For solid state devices which are responsive to visible or infrared radiant energy, see semiconductor device, photo.
0.0001 reliability failure rate level in percent, 25.000 microfarads single section capacitance value per section, -55.0 celsius minimum and 85.0 celsius maximum nonderated operating temp, established reliability indicator, no common or grounded electrodes, w/separate case terminal schematic diagram designator
Product Characteristics
Below you’ll find the complete technical specifications and performance data for this part, including material details and compliance information.
- Reliability Indicator
- established
- Reliability Failure Rate Level In Percent
- 0.0001
- Schematic Diagram Designator
- no common or grounded electrodes, w/separate case terminal
- Capacitance Value Per Section
- 25.000 microfarads single section
- Nonderated Operating Temp
- -55.0 celsius minimum and 85.0 celsius maximum
- Dc Leakage At Maximum Operating Temp
- 1.000 microamperes
- Nonderated Continuous Voltage Rating And Type Per Section
- 8.0 dc single section
- Capacitive Electrode Material
- tantalum
- Dc Leakage At Reference Temp
- 1.000 microamperes
- Reference Temp At Which Rated
- 25.0 celsius
- Material
- glass case
- Specification/Standard Data
- 81349-mil-c-39006/22d government specification
Related Parts
This NSN group includes multiple components designed to meet specific performance and operational standards. Each listing provides detailed specs, functionality data, and replacement compatibility information:
| Part Number | Name |
|---|---|
| M39006/22-0683 | Electrolytic Fixed Capacitor |
| MIL-C-39006/22D | Electrolytic Fixed Capacitor |
FAQs
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